Phase-sensitive characterization of short scale-length plasmas

J. P. Geindre; P. Audebert; F. Fallies; A. Rousse; J. C. Gauthier; A. Antonetti; J. P. Chambaret; G. Grillon; A. Mysyrowicz

Phase-sensitive characterization of short scale-length plasmas

J. P. Geindre
, P. Audebert
, F. Fallies
, A. Rousse
, J. C. Gauthier
, A. Antonetti
, J. P. Chambaret
, G. Grillon
, A. Mysyrowicz

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

Résumé

This paper presents the different methods of characterizing the phase-sensitivity of short scale length plasmas. From time-resolved measurements of the absolute reflectivity of a short probe pulse as a function of angle and polarization one can extract information on the plasma density gradient. A more direct method relies on the spectral analysis of the reflected probe beam at different delays. Another method is described with an improved sensitivity. These methods are tested in two different plasma regimes.

langue originale	Anglais
titre	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting
Editeur	Publ by IEEE
Pages	433-434
Nombre de pages	2
ISBN (imprimé)	0780319710
état	Publié - 1 janv. 1994
Evénement	Proceedings of the Conference on Lasers and Electro-Optics - Anaheim, CA, USA Durée: 8 mai 1994 → 13 mai 1994

Série de publications

Nom	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting
Volume	8

Une conférence

Une conférence	Proceedings of the Conference on Lasers and Electro-Optics
La ville	Anaheim, CA, USA
période	8/05/94 → 13/05/94

Contient cette citation

Geindre, J. P., Audebert, P., Fallies, F., Rousse, A., Gauthier, J. C., Antonetti, A., Chambaret, J. P., Grillon, G., & Mysyrowicz, A. (1994). Phase-sensitive characterization of short scale-length plasmas. Dans Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting (p. 433-434). (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting; Vol 8). Publ by IEEE.

@inproceedings{b61ac03d50cb431e9dd1941d1e782e66,

title = "Phase-sensitive characterization of short scale-length plasmas",

abstract = "This paper presents the different methods of characterizing the phase-sensitivity of short scale length plasmas. From time-resolved measurements of the absolute reflectivity of a short probe pulse as a function of angle and polarization one can extract information on the plasma density gradient. A more direct method relies on the spectral analysis of the reflected probe beam at different delays. Another method is described with an improved sensitivity. These methods are tested in two different plasma regimes.",

author = "Geindre, \{J. P.\} and P. Audebert and F. Fallies and A. Rousse and Gauthier, \{J. C.\} and A. Antonetti and Chambaret, \{J. P.\} and G. Grillon and A. Mysyrowicz",

year = "1994",

month = jan,

day = "1",

language = "English",

isbn = "0780319710",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting",

publisher = "Publ by IEEE",

pages = "433--434",

booktitle = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting",

note = "Proceedings of the Conference on Lasers and Electro-Optics ; Conference date: 08-05-1994 Through 13-05-1994",

}

Geindre, JP, Audebert, P, Fallies, F, Rousse, A, Gauthier, JC, Antonetti, A, Chambaret, JP, Grillon, G & Mysyrowicz, A 1994, Phase-sensitive characterization of short scale-length plasmas. Dans Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting. Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting, VOL. 8, Publ by IEEE, p. 433-434, Proceedings of the Conference on Lasers and Electro-Optics, Anaheim, CA, USA, 8/05/94.

Phase-sensitive characterization of short scale-length plasmas. / Geindre, J. P.; Audebert, P.; Fallies, F. et al.
Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting. Publ by IEEE, 1994. p. 433-434 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting; Vol 8).

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

TY - GEN

T1 - Phase-sensitive characterization of short scale-length plasmas

AU - Geindre, J. P.

AU - Audebert, P.

AU - Fallies, F.

AU - Rousse, A.

AU - Gauthier, J. C.

AU - Antonetti, A.

AU - Chambaret, J. P.

AU - Grillon, G.

AU - Mysyrowicz, A.

PY - 1994/1/1

Y1 - 1994/1/1

N2 - This paper presents the different methods of characterizing the phase-sensitivity of short scale length plasmas. From time-resolved measurements of the absolute reflectivity of a short probe pulse as a function of angle and polarization one can extract information on the plasma density gradient. A more direct method relies on the spectral analysis of the reflected probe beam at different delays. Another method is described with an improved sensitivity. These methods are tested in two different plasma regimes.

AB - This paper presents the different methods of characterizing the phase-sensitivity of short scale length plasmas. From time-resolved measurements of the absolute reflectivity of a short probe pulse as a function of angle and polarization one can extract information on the plasma density gradient. A more direct method relies on the spectral analysis of the reflected probe beam at different delays. Another method is described with an improved sensitivity. These methods are tested in two different plasma regimes.

M3 - Conference contribution

AN - SCOPUS:0028135978

SN - 0780319710

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting

SP - 433

EP - 434

BT - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting

PB - Publ by IEEE

T2 - Proceedings of the Conference on Lasers and Electro-Optics

Y2 - 8 May 1994 through 13 May 1994

ER -

Phase-sensitive characterization of short scale-length plasmas

Résumé

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