Résumé
State of the art CIGS thin films have been studied by means of the semiconductor-electrolyte junction. They appear as chemically robust allowing to use aggressive electrolyte compositions as for instance more acidic pH, down to 0 in sulfuric acid environment. In these electrolytes, reliable capacitance and photo-current related characterization techniques have been used. It has been shown that a short treatment in a gold (III) solution can facilitate the characterizations, and stabilize the surface composition. These results tend towards settling a standardized electrochemical testing procedure for CIGS layers.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | H971-H976 |
| journal | Materials Research Society Symposium - Proceedings |
| Volume | 668 |
| Les DOIs | |
| état | Publié - 1 janv. 2001 |
| Modification externe | Oui |
| Evénement | II - VI Compound Semiconductor Photovoltaic Materials - San Francisco, CA, États-Unis Durée: 16 avr. 2001 → 20 avr. 2001 |
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