Résumé
We propose a novel method for completely characterizing ultrashort pulses at extreme-ultraviolet (XUV) wavelengths by adapting the technique of spectral phase interferometry for direct electric-field reconstruction to this spectral region. Two-electron wave packets are coherently produced by photoionizing atoms with two time-delayed replicas of the XUV pulse. For one of the XUV pulses, photoionization occurs in the presence of a strong infrared pulse that ponderomotively shifts the binding energy, thereby providing the spectral shear needed for reconstruction of the spectral phase of the XUV pulse.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 2393-2395 |
| Nombre de pages | 3 |
| journal | Optics Letters |
| Volume | 28 |
| Numéro de publication | 23 |
| Les DOIs | |
| état | Publié - 1 déc. 2003 |
| Modification externe | Oui |
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