Résumé
Acceptors and vacancy-type defects have been investigated in traveling-heater-method-grown Hg0.8Cd0.2Te crystals by measuring the positron lifetime after 2.5-MeV electron irradiation in liquid hydrogen and annealing from 77 to 340 K. The results give evidence that negative VHg vacancies are introduced. They disappear slowly at room temperature over several weeks. Another monovacancy is also observed when the Fermi level is high in the gap. It is tentatively identified with the VTe vacancy. A recovery stage is observed between 150 and 280 K, the nature of which is discussed.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 9925-9931 |
| Nombre de pages | 7 |
| journal | Physical Review B |
| Volume | 52 |
| Numéro de publication | 14 |
| Les DOIs | |
| état | Publié - 1 janv. 1995 |
| Modification externe | Oui |
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