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Property analysis and design understanding in a quality-driven bounded model checking flow

  • University of Bremen

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Résumé

In the design process of digital systems, functional verification is a major issue. Generally, formal methods like bounded model checking (BMC) offer the highest quality of the verification results, especially when used in combination with techniques that check if a set of properties forms a complete specification of a design. However, in contrast to simulationbased methods, like random testing, formal verification requires a detailed knowledge of the design implementation. Formalizing a specification as a set of properties is a tedious and time consuming process. In this paper, we show the application of techniques to aid the verification engineer in writing properties in a qualitydriven BMC flow, that have been introduced in [1]. The first method can be used to remove redundant assumptions from properties and to separate different scenarios. The second technique, here called inverse property checking, takes an expected behavior of a design and automatically generates valid properties that can be checked for conformance with a specification. Both techniques can serve to reduce the number of iterations to obtain full coverage, when integrated with the verification flow. The benefits of the techniques are demonstrated with a memory management unit.

langue originaleAnglais
titre9th International Workshop on Microprocessor Test and Verification
Sous-titreCommon Challenges and Solutions, MTV 2008
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages88-93
Nombre de pages6
ISBN (imprimé)9780769535814
Les DOIs
étatPublié - 1 janv. 2008
Modification externeOui
Evénement2009 9th International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions, MTV 2008 - Austin, TX, États-Unis
Durée: 8 déc. 200810 déc. 2008

Série de publications

NomProceedings - International Workshop on Microprocessor Test and Verification
ISSN (imprimé)1550-4093

Une conférence

Une conférence2009 9th International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions, MTV 2008
Pays/TerritoireÉtats-Unis
La villeAustin, TX
période8/12/0810/12/08

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