Purity measurement in tetramethylsilane

F. Moreau; S. Tisserant; J. Guillon; C. de la Taille; P. Salin

doi:10.1016/0168-9002(91)90338-Q

Purity measurement in tetramethylsilane

F. Moreau
, S. Tisserant
, J. Guillon
, C. de la Taille
, P. Salin

École Polytechnique

Collége de France and IN2P3
Université Paris-Sud

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

3 Citations (Scopus)

Résumé

The electron lifetime in tetramethylsilane is measured by analyzing the current pulse shape generated by photoelectrons drifting in a parallel plate cell. Electron lifetime values of 189 ± 10 μs and 8.3 ± 0.3 μs have been measured in two different samples of liquids.

langue originale	Anglais
Pages (de - à)	309-314
Nombre de pages	6
journal	Nuclear Inst. and Methods in Physics Research, A
Volume	306
Numéro de publication	1-2
Les DOIs	https://doi.org/10.1016/0168-9002(91)90338-Q
état	Publié - 15 août 1991

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10.1016/0168-9002(91)90338-Q

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@article{f481bc700d0a4bb59d0f49e7c7e7a501,

title = "Purity measurement in tetramethylsilane",

abstract = "The electron lifetime in tetramethylsilane is measured by analyzing the current pulse shape generated by photoelectrons drifting in a parallel plate cell. Electron lifetime values of 189 ± 10 μs and 8.3 ± 0.3 μs have been measured in two different samples of liquids.",

author = "F. Moreau and S. Tisserant and J. Guillon and \{de la Taille\}, C. and P. Salin",

year = "1991",

month = aug,

day = "15",

doi = "10.1016/0168-9002(91)90338-Q",

language = "English",

volume = "306",

pages = "309--314",

journal = "Nuclear Inst. and Methods in Physics Research, A",

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TY - JOUR

T1 - Purity measurement in tetramethylsilane

AU - Moreau, F.

AU - Tisserant, S.

AU - Guillon, J.

AU - de la Taille, C.

AU - Salin, P.

PY - 1991/8/15

Y1 - 1991/8/15

N2 - The electron lifetime in tetramethylsilane is measured by analyzing the current pulse shape generated by photoelectrons drifting in a parallel plate cell. Electron lifetime values of 189 ± 10 μs and 8.3 ± 0.3 μs have been measured in two different samples of liquids.

AB - The electron lifetime in tetramethylsilane is measured by analyzing the current pulse shape generated by photoelectrons drifting in a parallel plate cell. Electron lifetime values of 189 ± 10 μs and 8.3 ± 0.3 μs have been measured in two different samples of liquids.

UR - https://www.scopus.com/pages/publications/22244476696

U2 - 10.1016/0168-9002(91)90338-Q

DO - 10.1016/0168-9002(91)90338-Q

M3 - Article

AN - SCOPUS:22244476696

SN - 0168-9002

VL - 306

SP - 309

EP - 314

JO - Nuclear Inst. and Methods in Physics Research, A

JF - Nuclear Inst. and Methods in Physics Research, A

IS - 1-2

ER -

Purity measurement in tetramethylsilane

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