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Quantifying the performances of SU-8 microfluidic devices: high liquid water tightness, long-term stability, and vacuum compatibility

  • Said Pashayev
  • , Romain Lhermerout
  • , Christophe Roblin
  • , Eric Alibert
  • , Jerome Barbat
  • , Rudy Desgarceaux
  • , Remi Jelinek
  • , Edouard Chauveau
  • , Saïd Tahir
  • , Vincent Jourdain
  • , Rasim Jabbarov
  • , Francois Henn
  • , Adrien Noury
  • Laboratoire Charles Coulomb
  • Azerbaijan Academy of Sciences
  • Laboratoire Interdisciplinaire de Physique

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

Despite several decades of development, microfluidics lacks a sealing material that can be readily fabricated, leak-tight under high liquid water pressure, stable over a long time, and vacuum compatible. In this paper, we report the performances of a micro-scale processable sealing material for nanofluidic/microfluidics chip fabrication, which enables us to achieve all these requirements. We observed that micrometric walls made of SU-8 photoresist, whose thickness range from 35 to 135 µm, are at least leak-tight to 1.5 bars and up to 5.5 bars, exhibit no water porosity even after 2 months of aging, and are able to sustain under 10-5 mbar vacuum. This sealing material is therefore reliable and versatile for building microchips, part of which must be isolated from liquid water under pressure or vacuum. Moreover, the fabrication process we propose does not require the use of either aggressive chemicals or high-temperature or high-energy plasma treatment. It thus opens a new perspective to seal microchips with sensitive surfaces containing nanomaterials.

langue originaleAnglais
Numéro d'article25
journalMicrofluidics and Nanofluidics
Volume28
Numéro de publication5
Les DOIs
étatPublié - 1 mai 2024
Modification externeOui

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