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Radiation hardening of silica glass through fictive temperature reduction

  • Matthieu Lancry
  • , B. Hari Babu
  • , Nadège Ollier
  • , Bertrand Poumellec
  • Institut de Chimie Moléculaire et des Matériaux d'Orsay
  • Université Paris-Saclay

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

The aim of this article was to report the effects of γ-radiation on type-I Infrasil silica glass with different fictive temperatures, Tf, for harsh environment applications. Radiation-induced attenuation in the visible range is found to be much lower in low fictive temperature samples. Photoluminescence experiments show that glasses with higher fictive temperatures have a higher nonbridging oxygen hole centers defect concentration generated by irradiation. In addition, electron paramagnetic resonance studies reveal higher E’ point defects, AlOHC, and hydrogen(II) defects in high Tf samples. In general, we find that the γ-radiation “hardness” of Infrasil301 silica glass becomes significantly higher with decreasing fictive temperature.

langue originaleAnglais
Pages (de - à)285-290
Nombre de pages6
journalInternational Journal of Applied Glass Science
Volume8
Numéro de publication3
Les DOIs
étatPublié - 1 sept. 2017
Modification externeOui

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