TY - GEN
T1 - Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis
AU - Pagliarini, Samuel N.
AU - Ban, Tian
AU - De Naviner, Lirida A.
AU - Naviner, Jean Francois
PY - 2013/12/1
Y1 - 2013/12/1
N2 - This paper proposes two heuristic-based approaches for assessing the reliability of combinational logic in digital circuits. Both approaches take into account reconvergent signals but limited to a first-order-only analysis. Our results show that both approaches lead to more accurate results. Average estimation errors can be 63% smaller for the studied circuits.
AB - This paper proposes two heuristic-based approaches for assessing the reliability of combinational logic in digital circuits. Both approaches take into account reconvergent signals but limited to a first-order-only analysis. Our results show that both approaches lead to more accurate results. Average estimation errors can be 63% smaller for the studied circuits.
U2 - 10.1109/MWSCAS.2013.6674598
DO - 10.1109/MWSCAS.2013.6674598
M3 - Conference contribution
AN - SCOPUS:84893200985
SN - 9781479900664
T3 - Midwest Symposium on Circuits and Systems
SP - 113
EP - 116
BT - 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
T2 - 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
Y2 - 4 August 2013 through 7 August 2013
ER -