TY - GEN
T1 - Selecting points of interest in traces using patterns of events
AU - Trahay, François
AU - Brunet, Élisabeth
AU - Bouksiaa, Mohamed Mosli
AU - Liao, Jianwei
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/1/1
Y1 - 2015/1/1
N2 - Over the past few years, the architecture of supercomputing platforms has evolved towards more complexity: multicore processors attached to multiple memory banks are now combined with accelerators. Exploiting such architecture often requires to mix programming models (MPI + CUDA for instance). As a result, understanding the performance of an application has become tedious. The use of performance analysis tools, such as tracing tools, now becomes unavoidable to optimize a parallel application. However, analyzing a trace file composed of millions of events requires a tremendous amount of work in order to spot the cause of the poor performance of an application. In this paper, we propose mechanisms for assisting application developers in their exploration of trace files. We propose an algorithm for detecting repetitive patterns of events in trace files. Thanks to this algorithm, a trace can be viewed as loops and groups of events instead of the usual representation as a sequential list of events. We also propose a method to filter traces in order to eliminate duplicated information and to highlight points of interest. These mechanisms allow the performance analysis tool to pre-select the subsets of the trace that are more likely to contain useful information. We implemented the proposed mechanism in the EZTrace performance analysis framework and the experiments show that detecting patterns in various benchmarking applications is done in reasonable time, even when the trace contains millions of events. We also show that the filtering process can reduce the quantity of information in the trace that the user has to analyze by up to 99 %.
AB - Over the past few years, the architecture of supercomputing platforms has evolved towards more complexity: multicore processors attached to multiple memory banks are now combined with accelerators. Exploiting such architecture often requires to mix programming models (MPI + CUDA for instance). As a result, understanding the performance of an application has become tedious. The use of performance analysis tools, such as tracing tools, now becomes unavoidable to optimize a parallel application. However, analyzing a trace file composed of millions of events requires a tremendous amount of work in order to spot the cause of the poor performance of an application. In this paper, we propose mechanisms for assisting application developers in their exploration of trace files. We propose an algorithm for detecting repetitive patterns of events in trace files. Thanks to this algorithm, a trace can be viewed as loops and groups of events instead of the usual representation as a sequential list of events. We also propose a method to filter traces in order to eliminate duplicated information and to highlight points of interest. These mechanisms allow the performance analysis tool to pre-select the subsets of the trace that are more likely to contain useful information. We implemented the proposed mechanism in the EZTrace performance analysis framework and the experiments show that detecting patterns in various benchmarking applications is done in reasonable time, even when the trace contains millions of events. We also show that the filtering process can reduce the quantity of information in the trace that the user has to analyze by up to 99 %.
U2 - 10.1109/PDP.2015.30
DO - 10.1109/PDP.2015.30
M3 - Conference contribution
AN - SCOPUS:84962911317
T3 - Proceedings - 23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2015
SP - 70
EP - 77
BT - Proceedings - 23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2015
A2 - Lilius, Johan
A2 - Daneshtalab, Masoud
A2 - Brorsson, Mats
A2 - Leppanen, Ville
A2 - Aldinucci, Marco
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2015
Y2 - 4 March 2015 through 6 March 2015
ER -