Signature of resonant Rayleigh scattering from microcavity polaritons: Angularly peaked coherent emission

J. Bloch; D. Birkedal; J. Shah; V. Thierry-Mieg

Signature of resonant Rayleigh scattering from microcavity polaritons: Angularly peaked coherent emission

J. Bloch
, D. Birkedal
, J. Shah
, V. Thierry-Mieg

Research and Invovation Department

Résultats de recherche: Contribution à une conférence › Papier › Revue par des pairs

Résumé

The measurement of resonant Rayleigh scattering (RRS) in semiconductor microcavities have been investigated using ultrafast spectral interferometry. The measurements identifies the RRS component of the secondary radiation, and distinguishes between RRS and photoluminescence. The sample is a GaAs cavity with a single 8 nm Ga_0.96In_0.04As quantum well at the anti-node, surrounded by two Ga_0.9Al_0.1As/AlAs Bragg mirrors. The unambiguous identification of RRS, and its angular distribution, dynamics, and dependence on cavity detuning, provide unique complementary information on microcavities.

langue originale	Anglais
Pages	302-303
Nombre de pages	2
état	Publié - 1 janv. 1999
Modification externe	Oui
Evénement	Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99) - Baltimore, MD, USA Durée: 23 mai 1999 → 28 mai 1999

Une conférence

Une conférence	Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99)
La ville	Baltimore, MD, USA
période	23/05/99 → 28/05/99

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@conference{568c4d64af624df5ba4ae515479b276b,

title = "Signature of resonant Rayleigh scattering from microcavity polaritons: Angularly peaked coherent emission",

abstract = "The measurement of resonant Rayleigh scattering (RRS) in semiconductor microcavities have been investigated using ultrafast spectral interferometry. The measurements identifies the RRS component of the secondary radiation, and distinguishes between RRS and photoluminescence. The sample is a GaAs cavity with a single 8 nm Ga0.96In0.04As quantum well at the anti-node, surrounded by two Ga0.9Al0.1As/AlAs Bragg mirrors. The unambiguous identification of RRS, and its angular distribution, dynamics, and dependence on cavity detuning, provide unique complementary information on microcavities.",

author = "J. Bloch and D. Birkedal and J. Shah and V. Thierry-Mieg",

year = "1999",

month = jan,

day = "1",

language = "English",

pages = "302--303",

note = "Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99) ; Conference date: 23-05-1999 Through 28-05-1999",

}

Signature of resonant Rayleigh scattering from microcavity polaritons: Angularly peaked coherent emission. / Bloch, J.; Birkedal, D.; Shah, J. et al.
1999. 302-303 Papier présenté � Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99), Baltimore, MD, USA.

Résultats de recherche: Contribution à une conférence › Papier › Revue par des pairs

TY - CONF

T1 - Signature of resonant Rayleigh scattering from microcavity polaritons

T2 - Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99)

AU - Bloch, J.

AU - Birkedal, D.

AU - Shah, J.

AU - Thierry-Mieg, V.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - The measurement of resonant Rayleigh scattering (RRS) in semiconductor microcavities have been investigated using ultrafast spectral interferometry. The measurements identifies the RRS component of the secondary radiation, and distinguishes between RRS and photoluminescence. The sample is a GaAs cavity with a single 8 nm Ga0.96In0.04As quantum well at the anti-node, surrounded by two Ga0.9Al0.1As/AlAs Bragg mirrors. The unambiguous identification of RRS, and its angular distribution, dynamics, and dependence on cavity detuning, provide unique complementary information on microcavities.

AB - The measurement of resonant Rayleigh scattering (RRS) in semiconductor microcavities have been investigated using ultrafast spectral interferometry. The measurements identifies the RRS component of the secondary radiation, and distinguishes between RRS and photoluminescence. The sample is a GaAs cavity with a single 8 nm Ga0.96In0.04As quantum well at the anti-node, surrounded by two Ga0.9Al0.1As/AlAs Bragg mirrors. The unambiguous identification of RRS, and its angular distribution, dynamics, and dependence on cavity detuning, provide unique complementary information on microcavities.

UR - https://www.scopus.com/pages/publications/0032637308

M3 - Paper

AN - SCOPUS:0032637308

SP - 302

EP - 303

Y2 - 23 May 1999 through 28 May 1999

ER -

Signature of resonant Rayleigh scattering from microcavity polaritons: Angularly peaked coherent emission

Résumé

Une conférence

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