TY - GEN
T1 - Simulation study of aging in CMOS binary adders
AU - An, Ting
AU - Cai, Hao
AU - De Barros Naviner, Lirida Alves
PY - 2014/1/1
Y1 - 2014/1/1
N2 - Hot carrier injection (HCI) and negative bias temperature instability (NBTI) become dominant reliability issues in nanometer CMOS technology. These aging effects can induce additional delay which will be accumulated through logic gates and thus degrade the performance of the circuits. This paper discusses performance degradations induced by aging mechanisms in digital integrated circuits. We propose an aging-aware synthesis flow taking into account NBTI and HCI. This flow is demonstrated through the implementation of several architectures of adders using CMOS technology. The simulation results show that Kogge-Stone Adder (KSA) and SKlansky Adder (SKA) are the best solutions whether in terms of the complexity or the resistance to aging effects with induced delay degradation below 0.35%.
AB - Hot carrier injection (HCI) and negative bias temperature instability (NBTI) become dominant reliability issues in nanometer CMOS technology. These aging effects can induce additional delay which will be accumulated through logic gates and thus degrade the performance of the circuits. This paper discusses performance degradations induced by aging mechanisms in digital integrated circuits. We propose an aging-aware synthesis flow taking into account NBTI and HCI. This flow is demonstrated through the implementation of several architectures of adders using CMOS technology. The simulation results show that Kogge-Stone Adder (KSA) and SKlansky Adder (SKA) are the best solutions whether in terms of the complexity or the resistance to aging effects with induced delay degradation below 0.35%.
UR - https://www.scopus.com/pages/publications/84906916721
U2 - 10.1109/MIPRO.2014.6859531
DO - 10.1109/MIPRO.2014.6859531
M3 - Conference contribution
AN - SCOPUS:84906916721
SN - 9789532330816
T3 - 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2014 - Proceedings
SP - 51
EP - 55
BT - 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2014 - Proceedings
PB - IEEE Computer Society
T2 - 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2014
Y2 - 26 May 2014 through 30 May 2014
ER -