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Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities

  • V. Bouffetier
  • , M. P. Valdivia
  • , L. Ceurvorst
  • , D. Stutman
  • , G. Rigon
  • , B. Albertazzi
  • , M. Koenig
  • , T. Pikuz
  • , N. Ozaki
  • , H. Nakamura
  • , Y. Hironaka
  • , K. Miyanishi
  • , T. Yabuuchi
  • , T. Togashi
  • , K. Sueda
  • , M. Yabashi
  • , T. Goudal
  • , D. Mancelli
  • , A. Casner
  • , G. Pérez-Callejo
  • Institute of Radiooncology - OncoRay
  • Stanford Linear Accelerator Center
  • University of Rochester Laboratory for Laser Energetics
  • Horia Hulubei National Institute of Physics and Nuclear Engineering
  • CNRS
  • Osaka University
  • RIKEN SPring-8 Center
  • JASRI/SPring-8
  • CEA/UVSQ/CNRS
  • CELIA, Université Bordeaux i, UMR 5107 (CNRS, Bordeaux 1, CEA)
  • Universidad de Valladolid

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.

langue originaleAnglais
Numéro d'article123508
journalReview of Scientific Instruments
Volume96
Numéro de publication12
Les DOIs
étatPublié - 1 déc. 2025

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