TY - GEN
T1 - Single event transient mitigation through pulse quenching
T2 - 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
AU - Pagliarini, Samuel N.
AU - Naviner, Lirida A.De B.
AU - Naviner, Jean Francois
PY - 2013/1/1
Y1 - 2013/1/1
N2 - This paper exploits the pulse quenching effect in order to reduce circuit error rates due to single event transients in combinational logic. Although the effect allows for substantial reduction in the sensitive area of a single cell, logical masking at circuit level has to be also considered. Our results show that pulse quenching has a limited effectiveness at circuit level. The results of the proposed approach can be used to drive a reliability-aware design flow.
AB - This paper exploits the pulse quenching effect in order to reduce circuit error rates due to single event transients in combinational logic. Although the effect allows for substantial reduction in the sensitive area of a single cell, logical masking at circuit level has to be also considered. Our results show that pulse quenching has a limited effectiveness at circuit level. The results of the proposed approach can be used to drive a reliability-aware design flow.
U2 - 10.1109/ICECS.2013.6815369
DO - 10.1109/ICECS.2013.6815369
M3 - Conference contribution
AN - SCOPUS:84901388411
SN - 9781479924523
T3 - Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
SP - 121
EP - 124
BT - 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 8 December 2013 through 11 December 2013
ER -