TY - GEN
T1 - Spectral and temporal phase measurement by optical frequency-domain reflectometry
AU - Calò, Cosimo
AU - Robillart, Bruno
AU - Gottesman, Yaneck
AU - Fall, Abdoulaye
AU - Lamare, François
AU - Merghem, Kamel
AU - Martinez, Anthony
AU - Ramdane, Abderrahim
AU - Bcnkelfat, Badr Eddine
PY - 2014/1/1
Y1 - 2014/1/1
N2 - In the present work, we report on the spectral and temporal phase measurement capabilities of OFDR. Precise characterization of spectral phase information is demonstrated by retrieving the phase response of a commercial optical filter, the Finisar Waveshaper 1000 S/X programmable in attenuation and phase over C+L band (1530-1625 nm). Additionally, we demonstrate the high sensitivity of the technique to Doppler effects, enabling the use of OFDR for the characterization of dynamical aspects of optoelectronic components.
AB - In the present work, we report on the spectral and temporal phase measurement capabilities of OFDR. Precise characterization of spectral phase information is demonstrated by retrieving the phase response of a commercial optical filter, the Finisar Waveshaper 1000 S/X programmable in attenuation and phase over C+L band (1530-1625 nm). Additionally, we demonstrate the high sensitivity of the technique to Doppler effects, enabling the use of OFDR for the characterization of dynamical aspects of optoelectronic components.
UR - https://www.scopus.com/pages/publications/84906751200
U2 - 10.1109/ICIPRM.2014.6880541
DO - 10.1109/ICIPRM.2014.6880541
M3 - Conference contribution
AN - SCOPUS:84906751200
SN - 9781479957293
T3 - Conference Proceedings - International Conference on Indium Phosphide and Related Materials
BT - 26th International Conference on Indium Phosphide and Related Materials, IPRM 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 26th International Conference on Indium Phosphide and Related Materials, IPRM 2014
Y2 - 11 May 2014 through 15 May 2014
ER -