Résumé
We have measured by X-ray resonant magnetic scattering the stripe domain nucleation field and the stripe domain critical width of FePd epitaxial films in a wide temperature range. A detailed quantitative analysis of our data in the framework of the rigorous theory of domain nucleation in thin films, allowed to determine the temperature dependence of both the exchange stiffness A and the anisotropy constant Ku. The proposed approach can be applied to thin magnetic films with perpendicular magnetic anisotropy, thus providing a way to measure A in a relevant class of magnetic materials.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | e895-e897 |
| journal | Journal of Magnetism and Magnetic Materials |
| Volume | 272-276 |
| Numéro de publication | SUPPL. 1 |
| Les DOIs | |
| état | Publié - 1 janv. 2004 |
| Modification externe | Oui |
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