Résumé
Polymorphous silicon-germanium (pm-SiGe:H) thin films with Ge contents varying from 1 to 35% were fabricated by plasma enhanced chemical vapour deposition in a high pressure range (1350 mtorr) and under high hydrogen dilution. The electrical and optical properties of these films were studied using a set of complementary techniques. These materials were then incorporated in the i layer of p-i-n solar cells. The performance of such solar cells and the use of these pm-SiGe alloys as the bottom cell of tandem pm-Si:H/pm-SiGe:H cells are finally discussed with the help of numerical simulations.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 247-251 |
| Nombre de pages | 5 |
| journal | Thin Solid Films |
| Volume | 427 |
| Numéro de publication | 1-2 |
| Les DOIs | |
| état | Publié - 3 mars 2003 |
| Evénement | E-MRS, K - Strasbourg, France Durée: 18 juin 2003 → 21 juin 2003 |
Empreinte digitale
Examiner les sujets de recherche de « Study of pm-SiGe:H thin films for p-i-n devices and tandem solar cells ». Ensemble, ils forment une empreinte digitale unique.Contient cette citation
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver