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Taming Coverage Criteria Heterogeneity with LTest

  • Michael Marcozzi
  • , Sebastien Bardin
  • , Mickael Delahaye
  • , Nikolai Kosmatov
  • , Virgile Prevosto
  • CEA
  • CEA/UVSQ/CNRS

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

6 Citations (Scopus)

Résumé

Automated white-box testing is a major issue in software engineering. In previous work, we introduced LTest, a generic and integrated toolkit for automated white-box testing of C programs. LTest supports a broad class of coverage criteria in a unified way (through the label specification mechanism) and covers most major parts of the testing process - including coverage measurement, test generation and detection of infeasible test objectives. However, the original version of LTest was unable to handle several major classes of coverage criteria, such as MCDC or dataflow criteria. Moreover, its practical applicability remained barely assessed. In this work, we present a significantly extended version of LTest that supports almost all existing testing criteria, including MCDC and some software security properties, through a native support of recently proposed hyperlabels. We also provide a more realistic view on the practical applicability of the extended tool, with experiments assessing its efficiency and scalability on real-world programs.

langue originaleAnglais
titreProceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages500-507
Nombre de pages8
ISBN (Electronique)9781509060313
Les DOIs
étatPublié - 15 mai 2017
Modification externeOui
Evénement10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 - Tokyo, Japon
Durée: 13 mars 2017 → 17 mars 2017

Série de publications

NomProceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017

Une conférence

Une conférence10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
Pays/TerritoireJapon
La villeTokyo
période13/03/17 → 17/03/17

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