TEM observations of nanometer thick cobalt deposits in alumina sandwiches

F. Fettar; J. L. Maurice; F. Petroff; L. F. Schelp; A. Vaurès; A. Fert

doi:10.1016/S0040-6090(97)01105-X

TEM observations of nanometer thick cobalt deposits in alumina sandwiches

F. Fettar
, J. L. Maurice
, F. Petroff
, L. F. Schelp
, A. Vaurès
, A. Fert

Thales Group

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.

langue originale	Anglais
Pages (de - à)	120-123
Nombre de pages	4
journal	Thin Solid Films
Volume	319
Numéro de publication	1-2
Les DOIs	https://doi.org/10.1016/S0040-6090(97)01105-X
état	Publié - 29 avr. 1998
Modification externe	Oui

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10.1016/S0040-6090(97)01105-X

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title = "TEM observations of nanometer thick cobalt deposits in alumina sandwiches",

abstract = "We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.",

keywords = "Amorphous alumina, Cobalt clusters, Transmission electron microscopy",

author = "F. Fettar and Maurice, \{J. L.\} and F. Petroff and Schelp, \{L. F.\} and A. Vaur{\`e}s and A. Fert",

year = "1998",

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T1 - TEM observations of nanometer thick cobalt deposits in alumina sandwiches

AU - Fettar, F.

AU - Maurice, J. L.

AU - Petroff, F.

AU - Schelp, L. F.

AU - Vaurès, A.

AU - Fert, A.

PY - 1998/4/29

Y1 - 1998/4/29

N2 - We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.

AB - We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.

KW - Amorphous alumina

KW - Cobalt clusters

KW - Transmission electron microscopy

UR - https://www.scopus.com/pages/publications/0032046255

U2 - 10.1016/S0040-6090(97)01105-X

DO - 10.1016/S0040-6090(97)01105-X

M3 - Article

AN - SCOPUS:0032046255

SN - 0040-6090

VL - 319

SP - 120

EP - 123

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

TEM observations of nanometer thick cobalt deposits in alumina sandwiches

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