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Temporal and far-field characterisation of the transient Ni-like Ag X-ray laser under traveling-wave irradiation

  • A. Klisnick
  • , J. Kuba
  • , D. Ros
  • , A. Carillon
  • , G. Jamelot
  • , R. Smith
  • , F. Strati
  • , G. J. Tallents
  • , R. Keenan
  • , S. J. Topping
  • , C. L.S. Lewis
  • , P. Nickles
  • , K. A. Janulewicz
  • , F. Bortolotto
  • , D. Neely
  • , R. Clarke
  • , J. Collier
  • , A. G. MacPhee
  • , C. Chenais-Popovics
  • , J. C. Chanteloup
  • D. Joyeux, D. Phalippou, H. Daido, H. Tang
  • Laboratoire de Spectroscopie Atomique et Ionique, URA 755 CNRS
  • Université Paris-Saclay
  • Czech Technical University in Prague
  • Lawrence Livermore National Laboratory
  • Department of Physics
  • University of York
  • School of Mathematics and Physics
  • Queen's University of Belfast
  • Max-Born-Institute
  • CCLRC Rutherford Appleton Laboratory
  • Institut d’Optique ThéOrique et Appliquée
  • CNRS
  • Japan Atom. Ener. Research Institute
  • Japan Atomic Energy Agency

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

5 Citations (Scopus)

Résumé

This paper summarises our recent progress achieved in the characterisation and understanding of the Ni-like Ag transient X-ray laser pumped under traveling wave irradiation. At the Rutherford Laboratory CPA laser facility, we measured the temporal history of the 13.9 nm laser pulse with a high-resolution streak camera. A very short, ∼2 ps X-ray laser pulse was directly demonstrated for the first time. More recently we carried out an experiment at the LULI CPA laser facility. Several diagnostics that recorded the plasma emission at the XRL wavelength or in the keV range indicate the presence of small-scale spatial structures in the emitting XRL source. Single-shot Fresnel interferograms at 13.9 nm were successfully obtained with a good fringe visibility. Strong lasing was also observed on the Ni-like 4f-4d line at 16 nm.

langue originaleAnglais
Pages (de - à)75-84
Nombre de pages10
journalProceedings of SPIE - The International Society for Optical Engineering
Volume4505
Les DOIs
étatPublié - 1 janv. 2001

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