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Temporal contrast in Ti:sapphire lasers: Characterization and control

  • Marc Nantel
  • , Jiro Itatani
  • , An Chun Tien
  • , Jérôme Faure
  • , Daniel Kaplan
  • , Marcel Bouvier
  • , Takashi Buma
  • , Paul Van Rompay
  • , John Nees
  • , Peter P. Pronko
  • , Donald Umstadter
  • , Gérard A. Mourou
  • University of Michigan
  • Photonics Research Ontario
  • University of Tokyo
  • RIKEN (The Institute of Physical and Chemical Research)
  • National Taiwan University
  • Alliage Inc.
  • IBM Watson Research Center
  • University of Michigan, Ann Arbor
  • French Physical Society
  • Medox Electro-Optics Inc.
  • LTHE (UMR 5564 CNRS/IRD/Université de Grenoble)
  • University of Rochester
  • Princeton University
  • IEEE

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

As ultrafast lasers achieve ever higher focused intensities on target, the problem of ensuring a clean laser-solid interaction becomes more pressing. In this paper, we give concrete examples of the deleterious effects of low-contrast interactions, and address the problem of subpicosecond laser intensity contrast ratio on both characterization and control fronts. We present the new technique of high-dynamic-range plasma-shuttered streak camera contrast measurement, as well as two efficient and relatively inexpensive ways of improving the contrast of short pulse lasers without sacrificing on the output energy: a double-pass Pockels cell (PC), and clean high-energy-pulse seeding of the regenerative amplifier.

langue originaleAnglais
Pages (de - à)449-458
Nombre de pages10
journalIEEE Journal on Selected Topics in Quantum Electronics
Volume4
Numéro de publication2
Les DOIs
étatPublié - 1 mars 1998
Modification externeOui

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