Résumé
The growth mechanisms of microcrystalline silicon thin films at low temperatures (100-250°C) by plasma CVD are still a matter of debate. We have shown that ue-Si:H formation proceeds through four phases (incubation, nucleation, growth and steady state) and that hydrogen plays a key role in this process, particularly during the incubation phase in which hydrogen modifies the amorphous silicon network and forms a highly porous phase where nucleation takes place. In this study we combine in-situ ellipsometry and dark conductivity measurements with ex-situ high resolution transmission electron microscopy to improve our understanding of microcrystalline silicon formation.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 559-563 |
| Nombre de pages | 5 |
| journal | Materials Science and Engineering: B |
| Volume | 69-70 |
| Les DOIs | |
| état | Publié - 19 janv. 2000 |
| Modification externe | Oui |
| Evénement | The European Materials Research Society 1999 Spring Meeting, Symposium I: Microcrystalline and Nanocrystalline Semiconductors - Strasbourg, France Durée: 1 juin 1999 → 4 juin 1999 |
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