TY - GEN
T1 - Thermal noise measurements on micro-cantilevers coated with dielectric materials
AU - Cagnoli, Gianpietro
AU - Dolique, Vincent
AU - Degallaix, Jerome
AU - Flaminio, Raffaele
AU - Forest, Daniele
AU - Granata, Massimo
AU - Michel, Christophe
AU - Morgado, Nazario
AU - Pinard, Laurent
AU - Aguilar, Felipe
AU - Li, Tianjun
AU - Geitner, Mickael
AU - Bellon, Ludovic
PY - 2013/9/16
Y1 - 2013/9/16
N2 - In recent years an increasing number of devices and experiments are shown to be limited by mechanical thermal noise. In particular sub-Hertz laser frequency stabilization and gravitational wave detectors, that are able to measure fluctuations of 10-18 m/√Hz or less, are being limited by thermal noise in the dielectric coatings deposited on mirrors. We present a novel technique of structural relaxation analysis based on the direct thermal noise measurements on micro-cantilevers and we compare it with the results obtained from the mechanical loss measurements. The dielectric coatings are deposited by ion beam sputtering. The results presented here give a loss angle of annealed tantala and as-deposited silica coatings of (3.9 ± 0.4) ṡ 10-4 and (5.8 ± 1.0) ṡ 10-4 respectively, from 10 Hz to 20 kHz.
AB - In recent years an increasing number of devices and experiments are shown to be limited by mechanical thermal noise. In particular sub-Hertz laser frequency stabilization and gravitational wave detectors, that are able to measure fluctuations of 10-18 m/√Hz or less, are being limited by thermal noise in the dielectric coatings deposited on mirrors. We present a novel technique of structural relaxation analysis based on the direct thermal noise measurements on micro-cantilevers and we compare it with the results obtained from the mechanical loss measurements. The dielectric coatings are deposited by ion beam sputtering. The results presented here give a loss angle of annealed tantala and as-deposited silica coatings of (3.9 ± 0.4) ṡ 10-4 and (5.8 ± 1.0) ṡ 10-4 respectively, from 10 Hz to 20 kHz.
UR - https://www.scopus.com/pages/publications/84883723848
U2 - 10.1109/ICNF.2013.6578891
DO - 10.1109/ICNF.2013.6578891
M3 - Conference contribution
AN - SCOPUS:84883723848
SN - 9781479906680
T3 - 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
BT - 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
T2 - 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
Y2 - 24 June 2013 through 28 June 2013
ER -