Résumé
We construct a diffuse-interface model of two-phase solidification that quantitatively reproduces the classic free boundary problem on solid-liquid interfaces in the thin-interface limit. Convergence tests and comparisons with boundary integral simulations of eutectic growth show good accuracy for steady-state lamellae, but the results for limit cycles depend on the interface thickness through the trijunction behavior. This raises the fundamental issue of diffuse multiple-junction dynamics.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 4 |
| Nombre de pages | 1 |
| journal | Physical Review E |
| Volume | 68 |
| Numéro de publication | 1 |
| Les DOIs | |
| état | Publié - 1 janv. 2003 |
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