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Triroc, a versatile 64-channel SiPM readout ASIC for time-of-flight PET

  • Salleh Ahmad
  • , Christophe De La Taille
  • , Julien Fleury
  • , Nathalie Seguin-Moreau
  • , Ludovic Raux
  • , Stephane Callier
  • , Gisele Martin-Chassard
  • , Frederic Dulucq
  • , Damien Thienpont
  • Weeroc
  • Omega (Centre de Microélectronique)-École Polytechnique

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

13 Citations (Scopus)

Résumé

Triroc is a highly configurable SiPM readout ASIC intended for PET prototyping with time-of-flight capability. This 64-channel ASIC incorporates a dual triggering system that will flag the arrival photons and provides energy cut-off at a specified level. Time and charge measurements are performed internally by 40ps-bin TDC and 10-bit ADC. The analog design of this ASIC has been optimized for accepting positive and negative polarity inputs while maintaining nearly similar performances for both input polarities. Channelby-channel input DC level adjustment is also available in order to correct the non-uniformity of SiPM array and fine tuning each pixel gain. Additionally, the digital conversions are assignable to other analog components, which extends the suitability of Triroc for any application requiring SiPM readout. The design of Triroc and the characterization results will be presented in this work.

langue originaleAnglais
titre2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
EditeurInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronique)9781509016426
Les DOIs
étatPublié - 16 oct. 2017
Modification externeOui
Evénement2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Durée: 29 oct. 2016 → 6 nov. 2016

Série de publications

Nom2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Une conférence

Une conférence2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Pays/TerritoireFrance
La villeStrasbourg
période29/10/16 → 6/11/16

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