Ultrafast time-resolved interferometry at femtosecond laser excited surfaces

V. V. Temnov; K. Sokolowski-Tinten; D. Von der Linde

Ultrafast time-resolved interferometry at femtosecond laser excited surfaces

V. V. Temnov
, K. Sokolowski-Tinten
, D. Von der Linde

University of Duisburg-Essen

Résultats de recherche: Contribution à une conférence › Papier › Revue par des pairs

Résumé

Ultrafast time-resolved interferometry at femtosecond laser excited surfaces was developed. An imaging Michelson interferometer was integrated into an optical pump-probe setup. The interferograms were analyzed using a two-dimensional Fourier transform algorithm to reconstruct amplitude and phase. The interferometric setup allowed accurate measurements of transient surface deformations with a vertical sensitivity of >1 nm, a temporal resolution of 100 fs, and a lateral spatial resolution of 1-2μm.

langue originale	Anglais
Pages	32
Nombre de pages	1
état	Publié - 1 janv. 2002
Modification externe	Oui
Evénement	Conference on Lasers and Electro-Optics (CLEO 2002) - Long Beach, CA, États-Unis Durée: 19 mai 2002 → 24 mai 2002

Une conférence

Une conférence	Conference on Lasers and Electro-Optics (CLEO 2002)
Pays/Territoire	États-Unis
La ville	Long Beach, CA
période	19/05/02 → 24/05/02

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title = "Ultrafast time-resolved interferometry at femtosecond laser excited surfaces",

abstract = "Ultrafast time-resolved interferometry at femtosecond laser excited surfaces was developed. An imaging Michelson interferometer was integrated into an optical pump-probe setup. The interferograms were analyzed using a two-dimensional Fourier transform algorithm to reconstruct amplitude and phase. The interferometric setup allowed accurate measurements of transient surface deformations with a vertical sensitivity of >1 nm, a temporal resolution of 100 fs, and a lateral spatial resolution of 1-2μm.",

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AU - Temnov, V. V.

AU - Sokolowski-Tinten, K.

AU - Von der Linde, D.

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Y1 - 2002/1/1

N2 - Ultrafast time-resolved interferometry at femtosecond laser excited surfaces was developed. An imaging Michelson interferometer was integrated into an optical pump-probe setup. The interferograms were analyzed using a two-dimensional Fourier transform algorithm to reconstruct amplitude and phase. The interferometric setup allowed accurate measurements of transient surface deformations with a vertical sensitivity of >1 nm, a temporal resolution of 100 fs, and a lateral spatial resolution of 1-2μm.

AB - Ultrafast time-resolved interferometry at femtosecond laser excited surfaces was developed. An imaging Michelson interferometer was integrated into an optical pump-probe setup. The interferograms were analyzed using a two-dimensional Fourier transform algorithm to reconstruct amplitude and phase. The interferometric setup allowed accurate measurements of transient surface deformations with a vertical sensitivity of >1 nm, a temporal resolution of 100 fs, and a lateral spatial resolution of 1-2μm.

UR - https://www.scopus.com/pages/publications/0036459082

M3 - Paper

AN - SCOPUS:0036459082

SP - 32

T2 - Conference on Lasers and Electro-Optics (CLEO 2002)

Y2 - 19 May 2002 through 24 May 2002

ER -

Ultrafast time-resolved interferometry at femtosecond laser excited surfaces

Résumé

Une conférence

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