Passer à la navigation principale Passer à la recherche Passer au contenu principal

X-ray spectroscopic studies of the electronic density and temperature profiles in the transport region of 0.53- and 0.26-m laser plasmas

  • P. Alaterre
  • , C. Chenais-Popovics
  • , P. Audebert
  • , J. P. Geindre
  • , J. C. Gauthier
  • LPP
  • Centre de Nanosciences et de Nanotechnologies

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

We present the first space-resolved experimental determination of electronic density and temperature profiles in the transport region for plane target irradiation with 400600-ps pulses at 0.53- and 0.26-m wavelengths, and (13)×1014-W/cm2 laser intensity. The experimental technique is x-ray spot spectroscopy on thin Al microdots deposited on a carbon substrate. A knife-edge imaging technique ensures a spatial resolution of 3 m along the laser axis. The electronic density and temperature are deduced from Stark broadening and intensity ratios of Al11+ and Al12+ n=4 resonance lines, respectively. The experimental profiles are well reproduced by one-dimensional spherical simulations including nonlocalized thermal flux inhibition or very low inhibition.

langue originaleAnglais
Pages (de - à)324-331
Nombre de pages8
journalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume32
Numéro de publication1
Les DOIs
étatPublié - 1 janv. 1985
Modification externeOui

Empreinte digitale

Examiner les sujets de recherche de « X-ray spectroscopic studies of the electronic density and temperature profiles in the transport region of 0.53- and 0.26-m laser plasmas ». Ensemble, ils forment une empreinte digitale unique.

Contient cette citation